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Scanning electron microscope
Results: 580

#	Item
281	Plasma-FIB (Focused Ion Beam) The C2MI plasma-FIB is mainly used to perform micro crosssections on samples by using an ion source. The ion source is focused on the sample to obtain a small beam that can etch the surface Add to Reading List Source URL: www.c2mi.ca Language: English - Date: 2014-11-24 15:51:29 Semiconductor device fabrication Electron microscopy Thin film deposition Ions Focused ion beam Ion beam Ion source Fib Scanning electron microscope Chemistry Scientific method Physics
282	IEEE/ASME TRANSACTIONS ON MECHATRONICS, VOL. 5, NO. 2, JUNE[removed]Controlled Pushing of Nanoparticles: Modeling and Experiments Add to Reading List Source URL: nanolab.me.cmu.edu Language: English - Date: 2012-11-16 19:15:36 Nanotechnology Intermolecular forces Atomic force microscopy Nanoparticle Electron Magnetic force microscope Local oxidation nanolithography Scanning probe microscopy Physics Science
283	Two-Dimensional Vision-Based Autonomous Microparticle Manipulation using a Nanoprobe Chytra Pawashe and Metin Sitti Nanorobotics Laboratory Scaife Hall 305 Department of Mechanical Engineering Add to Reading List Source URL: nanolab.me.cmu.edu Language: English - Date: 2012-11-16 19:15:37 Microscopy Materials science Scanning probe microscopy Atomic force microscopy Optical microscope Microscope Optical fiber AFM probe Electron microscope Nanotechnology Science Scientific method
284 $Chemistry / Electron microscope / Scanning electron microscope / Ion beam / Optical microscope / Microscope / Ion milling machine / Electron backscatter diffraction / Focused ion beam / Scientific method / Electron microscopy / Science$	Ion Milling: Improving sample preparation The C2MI ion milling tool is mainly used as the final preparation step for metallographic cut (cross-section[removed]mm wide argon ion beam is used mechanically to etch the sample Add to Reading List Source URL: www.c2mi.ca Language: English - Date: 2014-11-24 15:47:45 Chemistry Electron microscope Scanning electron microscope Ion beam Optical microscope Microscope Ion milling machine Electron backscatter diffraction Focused ion beam Scientific method Electron microscopy Science
285	Assessing Mechanisms of Granite Decomposition, ASAS 2006 poster Add to Reading List Source URL: www.statemuseum.arizona.edu Language: English - Date: 2014-05-05 16:13:17 Spectroscopy Chemical pathology American Old West American folklore Tombstone Arizona Granite X-ray fluorescence Headstone Scanning electron microscope Chemistry Science Scientific method
286	Electron Microscopy Laboratory Studies of Nuclear Materials The Electron Microscopy Laboratory is equipped with Scanning Electron Microscopes (SEM) and a Transmission Electron Microscope (TEM) adapted for the examination Add to Reading List Source URL: ec.europa.eu Language: English - Date: 2013-04-16 09:09:00 Actinides Nuclear materials Electron microscopy Nuclear reprocessing Nuclear chemistry Plutonium Scanning electron microscope Radioactive waste Nuclear fuel Chemistry Nuclear technology Nuclear physics
287	PhD Candidate Position at the Laboratory for Electron Microscopy, Karlsruhe Institute of Technology (Karlsruhe, Germany) Nanotechnology requires imaging techniques with nanometer spatial resolution which yield quantitati Add to Reading List Source URL: www.lem.kit.edu Language: English - Date: 2014-07-03 04:32:24 Physics Electron microscope Transmission electron microscopy Microscope Scanning transmission electron microscopy Microscopy Focused ion beam Scanning electron microscope Electron Electron microscopy Scientific method Science
288	Nuclear Safeguards and non-Proliferation Environmental Sampling Analysis A key topic in international Safeguards is the work in preventing further spread of nuclear weapon technology and nuclear materials that can be use Add to Reading List Source URL: ec.europa.eu Language: English - Date: 2013-04-16 09:09:43 Mass spectrometry Electron microscopy Spectroscopy Measuring instruments Atomic physics Secondary ion mass spectrometry Cameca Institute for Transuranium Elements Scanning electron microscope Scientific method Science Chemistry
289	Scanning electron microscope (SEM) Application:  Appraisal of polymers, stone, glass et cetera Add to Reading List Source URL: www.isc.fraunhofer.de Language: English - Date: 2014-03-14 10:01:39 Chemistry Scanning electron microscope Electron microscope Glass Sodium Vacuum Water vapor Electron Physics Scientific method Electron microscopy
290	FRAUNHOFER CAM IS A COMPETENCE CENTER FOR MICROSTRUCTURE DIAGNOSTICS A N D M AT E R I A L C H A R A C T E R I Z AT I O N WITHIN FRAUNHOFER IWM IN HALLE FRAUNHOFER CENTER Add to Reading List Source URL: www.iwm.fraunhofer.de Language: English - Date: 2014-05-20 04:27:23 Nanoparticle Electron microscope Environmental scanning electron microscope Nanotechnology Electron microscopy Science Scanning electron microscope

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